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Repositorio Atenea de la Facultad de Ciencias, UNAM >
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Please use this identifier to cite or link to this item:
http://hdl.handle.net/11154/2548
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| Title: | Spectroscopic ellipsometry characterization of Er3+-doped titania thin films prepared by the sol-gel method |
| Authors: | Palomino-Merino, R
Mendoza-Galvan, A
Martínez, G
Castano, V
Rodríguez, R |
| Issue Date: | 2001 |
| Abstract: | Titania thin films prepared by the sol-gel method were optically characterized by spectroscopic ellipsometry. These films were doped with Er3+ and supported on silicon wafers chemically activated by using the, dipping method. The dielectric function was modeled using the Forouhi-Bloomer model, which provides also the refractive index and the thickness of the film. |
| URI: | http://hdl.handle.net/11154/2548 |
| ISSN: | 0030-4026 |
| Appears in Collections: | Ciencias
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