dc.contributor.author |
Yousif, FB |
|
dc.contributor.author |
Martínez, H |
|
dc.date.accessioned |
2011-01-22T10:26:39Z |
|
dc.date.available |
2011-01-22T10:26:39Z |
|
dc.date.issued |
2004 |
|
dc.identifier.issn |
1063-651X |
|
dc.identifier.uri |
http://hdl.handle.net/11154/1589 |
|
dc.description.abstract |
This paper deals with the measurement of the mobility of negative ions in the mixtures of CCl4 with Ar with the CCl4 ratio up to 33.3%. The pulsed Townsend technique was employed to produce an integrated ionic avalanche over a range of the density-reduced electric field E/N for which ionization is either negligible or absent, and attachment processes are dominant, leading to the formation of mostly CCl4-. The E/N range of measurement was 1-50 Td (1 Td=10(-17) V cm(2)). Our measurements strongly suggest that attachment is the dominant process and only negative ions are formed. |
en_US |
dc.language.iso |
en |
en_US |
dc.title |
Negative ion formation and motion in a mixture of CCl4 and Ar |
en_US |
dc.type |
Article |
en_US |
dc.identifier.idprometeo |
1807 |
|
dc.identifier.doi |
10.1103/PhysRevE.69.046401 |
|
dc.source.novolpages |
69(4) |
|
dc.subject.wos |
Physics, Fluids & Plasmas |
|
dc.subject.wos |
Physics, Mathematical |
|
dc.description.index |
WoS: SCI, SSCI o AHCI |
|
dc.relation.journal |
Physical Review E |
|