Ciencias,UNAM

Negative ion motion in the mixtures of SF6 with CF4 and CH4-Ar

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dc.contributor.author de Urquijo, J
dc.contributor.author Yousif, FB
dc.date.accessioned 2011-01-22T10:26:43Z
dc.date.available 2011-01-22T10:26:43Z
dc.date.issued 2003
dc.identifier.issn 1063-651X
dc.identifier.uri http://hdl.handle.net/11154/1670
dc.description.abstract This paper deals with the measurement of the mobility of negative ions in the mixtures of SF6 with CF4 and the CH4-Ar (50:50) binary mixture with SF6 contents up to 50%. The pulsed Townsend technique was used to observe the integrated ionic avalanches over a range of the density-reduced electric field E/N for which ionization is either negligible or absent, and attachment processes are significant, leading to the formation of mostly SF6-. The E/N range of measurement was from 1 to 70 Td (1 Td=10(-17) V cm(2)), over which the measured mobilities were found to be almost constant. The mobility of the negative ions was also measured for trace amounts of SF6 in CH4 and Ar and 1% CF4, thereby providing a good value of the mobility of SF6- in these pure gases, in order to test the measured mobilities with Blanc's law. We have found good agreement, within quoted experimental uncertainties, between calculated and measured values. en_US
dc.language.iso en en_US
dc.title Negative ion motion in the mixtures of SF6 with CF4 and CH4-Ar en_US
dc.type Article en_US
dc.identifier.idprometeo 1919
dc.identifier.doi 10.1103/PhysRevE.68.046406
dc.source.novolpages 68(4)
dc.subject.wos Physics, Fluids & Plasmas
dc.subject.wos Physics, Mathematical
dc.description.index WoS: SCI, SSCI o AHCI
dc.relation.journal Physical Review E

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